2002

On June 25th and 26th of 2002 we were able to participate in some high yield shots at LLE. We tested 17 graphite disks, seven, 1 cm thick and ten, 2 cm thick, as tertiary neutron detectors. Our main objective was to determine if the length of time each disk was baked during the purification procedure played a role in the level of contamination found in the disks. From the data obtained, it was determined that the bake out time played no role in decreasing the contamination. After one hour of bake out, possibly even less, all impurities removed by the oven were complete. In the future we hope to determine the optimal amount of time the disks should be backfilled with Argon. The disks used in these runs were all backfilled for three hours.

Raw Data :
Thick Disks - 401 402 403 404 405 406 407 408 409 410
Thin Disks - 411 412 414 416 417 418

Compilation of Raw Data for 1 cm disks
1 cm Disks Normalized to Yield
1 cm Disks Normalized to Yield and Time Shifted

Compilation of Raw Data for 2 cm disks
2 cm Disks Normalized to Yield
2 cm Disks Normalized to Yield and Time Shifted

Comparison of Final Counts for Normalized Data

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