Conclusion

• Samples can only be etched and viewed once, further attempts to etch will result in imaging problems such as gold flaking and imaging-induced damage
• Depth profiles can be constructed using parallax only for relatively large holes
• The diameter of holes increases linearly as a function of etch time
• The SEM can be used to scan an entire piece of CR-39, but factors such as total scan time decrease its appeal as a new method of scanning